Abstract/Details

Microscopic and spectroscopic analysis of tungsten trioxide and titanium-doped tungsten trioxide thin films


2012 2012

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Abstract (summary)

Tungsten oxide (WO3) has been a subject of high interest for its unique properties, and recently for its importance in different types of industrial applications which ranges from non-emissive displays, optical, microelectronic, catalytic/photocatalytic, humidity, temperature, gas, and biosensor devices. In this study, WO3 and Ti doped thin films were prepared using radio frequency magnetron reactive sputtering at different substrate temperatures ranging from room temperature to 500 °C in increments of 100 °C. After forming a hypothesis based on knowledge of established WO3 properties, we attempt in this work to investigate how the doping influences the roughness and the mean grain size of the nanoparticles on the surface layer of the thin films, its structure, and crystallinity. Therefore we pursued analysis by Atomic Force Microscopy (AFM), X-ray diffraction (XRD), and Raman spectroscopy, using a comparative approach. The outcomes of these analyses demonstrate that higher temperatures are necessary for growing crystalline material if doping is used. Also, smaller nanoparticles are obtained when a small amount of dopant, e.g. 5% Ti, is incorporated. Both XRD and Raman measurement indicate morphological changes of the doped material. Finally, annealing of the amorphous doped samples at temperatures of 600 °C and 900 °C did not contribute significantly to material properties improvement.

Indexing (details)


Subject
Analytical chemistry;
Nanoscience;
Energy;
Materials science
Classification
0486: Analytical chemistry
0565: Nanoscience
0791: Energy
0794: Materials science
Identifier / keyword
Pure sciences, Applied sciences, Afm, Mox sensors, Raman, Thin films, Titanium doped tungsten trioxide, Tungsten trioxide
Title
Microscopic and spectroscopic analysis of tungsten trioxide and titanium-doped tungsten trioxide thin films
Author
Yun, Young Taek
Number of pages
85
Publication year
2012
Degree date
2012
School code
0459
Source
DAI-B 73/10(E), Dissertation Abstracts International
Place of publication
Ann Arbor
Country of publication
United States
ISBN
9781267404633
Advisor
Manciu, Felicia S.
Committee member
Arrowood, Roy M.; Chianelli, Russell R.; Durrer, William G.; Murr, Lawrence E.
University/institution
The University of Texas at El Paso
Department
Matl. Sci. And Engin.
University location
United States -- Texas
Degree
Ph.D.
Source type
Dissertations & Theses
Language
English
Document type
Dissertation/Thesis
Dissertation/thesis number
3512024
ProQuest document ID
1024425077
Copyright
Database copyright ProQuest LLC; ProQuest does not claim copyright in the individual underlying works.
Document URL
http://search.proquest.com/docview/1024425077
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