Abstract/Details

Dynamics of pseudo-partial wetting studied by neutron reflectometry


1998 1998

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Abstract (summary)

We have presented a new analysis technique for neutron reflectometry. It is based on a combination of different scattering models coexisting side by side within the same sample. It extends possible applications of neutron reflectometry to non-uniform samples.

We present here the first results of an application of this technique to study pseudo-partial wetting dynamics in the process of condensation/evaporation of an octane on the liquid (surfactant modified aqueous solution) and solid (polished 111 silicon crystal) substrates. We describe the pseudo-partial wetting--a wetting regime, characterized by the coexistence of a thin liquid film and its residual droplet. The origin of this phenomenon is in van der Waals interaction between the substrate and air through the wetting liquid agent. We review two different approaches to calculate these interactions and use Lifshitz theory to estimate Hamaker constant for the silicon-octane-air system. Negative sign of this constant is a necessary condition for the pseudo-partial wetting.

We describe the dynamics of structural changes of the oil layer on substrate surface in the process of oil condensation/evaporation, Our neutron reflectometry data (analyzed on the basis of the new approach) demonstrate the presence of pseudo-partial wetting in this process and confirm its predicted dynamics.

Indexing (details)


Subject
Fluid dynamics;
Gases;
Optics;
Chemistry
Classification
0759: Fluid dynamics
0759: Gases
0752: Optics
0494: Chemistry
Identifier / keyword
Pure sciences; Neutron reflectometry; Pseudo-partial wetting; Wetting
Title
Dynamics of pseudo-partial wetting studied by neutron reflectometry
Author
Esibov, Levon A.
Number of pages
60
Publication year
1998
Degree date
1998
School code
0186
Source
DAI-B 59/08, Dissertation Abstracts International
Place of publication
Ann Arbor
Country of publication
United States
ISBN
0591996766, 9780591996760
Advisor
Steyerl, Albert
University/institution
University of Rhode Island
University location
United States -- Rhode Island
Degree
Ph.D.
Source type
Dissertations & Theses
Language
English
Document type
Dissertation/Thesis
Dissertation/thesis number
9902559
ProQuest document ID
304478503
Copyright
Database copyright ProQuest LLC; ProQuest does not claim copyright in the individual underlying works.
Document URL
http://search.proquest.com/docview/304478503
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