Abstract/Details

Power and yield -aware design and test of nano-scale CMOS circuits


2005 2005

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Abstract (summary)

Over the last few decades, semiconductor industry has been fueled by exponential growth in computing power resulting from aggressive miniaturization of device geometry. As device integration and design complexity increase drastically with technology scaling, design and test professionals face major challenges. Leakage current increases exponentially with scaling. Increasing power dissipation and power density have also emerged as important design considerations and major barrier to scaling. Moreover, process parameter variations pose a major yield concern. In my doctoral research, I have addressed some of the major challenges in design and test of nanoscale VLSI systems. I have developed efficient design techniques to reduce system power in both standby and active mode while maintaining performance. Application of these techniques to architectural and logic-level of design abstraction has been addressed. To improve test cost and confidence. I have considered developing design techniques, which are low power and at the same time, testable. Finally. I have explored a novel defect-based-test solution to test CMOS circuits using the dynamic supply current. I have proposed wavelet transform based current signature analysis for efficient failure detection in digital and analog circuits and fault localization in digital circuits.

Indexing (details)


Subject
Electrical engineering
Classification
0544: Electrical engineering
Identifier / keyword
Applied sciences; CMOS; Nanoscale; Power-aware; Yield-aware
Title
Power and yield -aware design and test of nano-scale CMOS circuits
Author
Bhunia, Swarup
Number of pages
224
Publication year
2005
Degree date
2005
School code
0183
Source
DAI-B 66/08, Dissertation Abstracts International
Place of publication
Ann Arbor
Country of publication
United States
ISBN
9780542273537, 0542273535
Advisor
Roy, Kaushik
University/institution
Purdue University
University location
United States -- Indiana
Degree
Ph.D.
Source type
Dissertations & Theses
Language
English
Document type
Dissertation/Thesis
Dissertation/thesis number
3185708
ProQuest document ID
305423069
Copyright
Database copyright ProQuest LLC; ProQuest does not claim copyright in the individual underlying works.
Document URL
http://search.proquest.com/docview/305423069
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